Functional and topological properties study by SPM

 Our group focuses on the study of functional topological defects in ferroelectric (FE) and ferromagnetic (FM) materials via advanced scanning probe microscopy (SPM) techniques. Our research encompasses both exploring the underlying physics in domain walls, skyrmions and vortices of oxide and van der Waals (vdW) materials, as well as leveraging these novel functionalities for post-Moore’s law nanoelectronics, such as full vdW field-effect transistor with in-memory computation and nonvolatile ferroelectric domain wall memory with neuromorphic functionality.

About the presenter

CI Jan Seidel and his team are working within FLEET’s Research Theme 1, Topological Materials.