Advanced thin film x-ray diffraction techniques

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  • Advanced thin film x-ray diffraction techniques
     12 Sep 2019
     10:00 am - 3:00 pm

Advanced thin film x-ray diffraction techniques

FREE ADMISSION ****RSVP ESSENTIAL****

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Dr. Daniel Sando

MWAC and School of Materials Science and Engineering, UNSW

TOPICS COVERED:

Part 1:

Refresher on basics of x-ray diffraction (XRD).

XRD for thin films: θ-2θ scans, rocking curves, Φ-scans.

Part 2:

Advanced techniques: pole figures, reciprocal space mapping (RSM).

OUTCOMES: 

Determine phase purity and lattice parameters of a thin film.

Evaluate crystalline quality of an epitaxial thin film.

Determine texturing and/or epitaxial relationship of a thin film.

Identify film/substrate heterostructures from a set of data.

Venue:  

Venue Website:

Address:
M10 Chemical Sciences Building, UNSW Sydney, New South Wales

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